The multi-mode gas cluster ion source (GCIS) is designed to operate in both Ar n + cluster and Ar + monatomic modes making it suitable for sputter cleaning and depth profiling organic, inorganic and ...

Precisely quantifying metal oxide samples’ chemical compositions with X-ray photoelectron spectroscopy (XPS) may be adversely impacted by adventitious carbon contamination, which is often found on the ...

This article discusses the analysis of elemental concentration in the near surface region of smart-phone display glass using the technique of depth profiling. The distribution of alkali and alkali ...