Any switching system can connect A to B. Only a well-designed one delivers top performance. Well-designed test systems have a minimum of three major subsystems: computing, instrumentation, and ...

High-voltage silicon-carbide (SiC) MOSFETs and diodes combine the advantages of fast switching speeds and very low switching losses. This allows power converters designed with them to operate at ...

Ideally a test engineer would connect a separate instrument to each test point of a Device Undergoing Test (DUT), thereby providing the highest performance and most accurate measurements. But this is ...

Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...