To read more news from IMS 2006, see the links box in our main IMS story: “RF enables “mobile living room.” Suss MicroTec demonstrated its new |Z| RF probe card for production test as well as its new ...

Continuing increases in the speed of semiconductor devices combined with higher levels of integration, on-chip wireless functions, and the usage of mixed-signal-device designs are driving new ...

Seamlessly integrated system combines TITAN™ Probes and MPI's wafer-level expertise to unlock precision measurements for next-generation semiconductors and sub-THz applications MPI TITAN™ 250 GHz ...

HSINCHU, Taiwan, Nov. 14, 2018 /PRNewswire/ -- MPI Corporation introduces a new 300 mm fully-automatic TS3500 wafer probe systems series with WaferWallet™. Over the past decade, the semiconductor ...

On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions. These techniques enable the direct ...

In this interview, Jeremy Hope from Wentworth Laboratories talks to AZoM about why they are attending electronica. Please tell us about the company Wentworth Labs and why you are attending electronica ...

The huge number of ICs used in today’s electronic products is difficult to comprehend, and each one has to be tested. Traditionally, testing starts at the wafer level to determine gross defects. By ...

Demands for mission critical wireless services such as autonomous driving and telehealth require higher data transfer rates and lower latencies. Such applications are now driving the use of radio ...

The continuing advances in semiconductor functionality, density, and chip-level integration are generating new challenges in accessing devices for test and controlling the physical and electrical ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...