Electronic Design

What’s Next for Physically Aware DFT?

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...
EDN

ITC tutorials span DFT basics to RF test

The 2006 International Test Conference is scheduled for the week of October 22 in Santa Clara, CA. For more on this year’s ITC, read our interview with program chair Anne Gattiker. Semiconductor test ...
Semiconductor Engineering

Preparing For Test Early In The Design Flow

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...
EDN

DFT software tackles test costs

BALTIMORE — The marriage of design-for-test (DFT) software with test hardware may drastically lower the cost of test, according to several companies that will present their plans at this week's ...
Electronic Design

Where Is DFT Heading?

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...