This paper provides an example of yield enhancement using virtual fabrication. A 6 transistors based static random access memory example on 7nm node technology was used in this case study.

During my earlier career as a process integration engineer, one of my primary responsibilities was to find yield enhancement opportunities by investigating underlying relationships between bin ...

As designs transition from 130nm to 90nm and below, designers must consider manufacturing effects early in the design cycle. Shrinking design nodes, larger designs, and expanding design complexity ...

As bleeding edge chip designs drop below 90nm, yield analysis is a must and is no longer just an optional check. To address this issue, Mountain View, Calif.-based EDA startup Ponte Solutions Inc. has ...